Deposit the library
Co-sputtering from several targets grades a controlled composition spread across one 100 mm wafer.
Combinatorial thin-film libraries
xemx makes 342 different compositions in a single deposition run and measures every one. One run tells you which composition to carry into your own test plan, and which to rule out.
Work spans semiconductor and packaging, hydrogen and electrochemistry, extreme environments, RF and magnetic films, superconducting films, and implantable coatings.
The same library points to different regions depending on which property you measure.
What we do
xemx is a Ruhr-Universität Bochum spin-off. Every spot comes from the same run, so when one part of the wafer behaves better, that is the film talking, not the gap between two runs.
Lineage
The library method and its data tools come from Alfred Ludwig's group at RUB. The droplet cell and cell microscopy used to screen the libraries come from Wolfgang Schuhmann's group there.
Lars Banko worked on both sides, often on the same papers, for several years before founding xemx.
One run, several targets, a graded spread of compositions across the wafer.
How it works
Co-sputtering from several targets grades a controlled composition spread across one 100 mm wafer.
XRD for structure, EDX for composition, and a probe for the target property, all mapped to the same wafer positions.
The map shows where the target property improves and which regions to rule out.
The chosen compositions are made again as uniform films, the same all the way across. Off the gradient, in other words: one composition everywhere instead of a spread.
The uniform film goes to a fab, supplier, or partner for the next test.
Where to start
Most people arrive already part-way through the problem. Pick the one that matches where your decision actually sits.
Search a broad set of candidate compositions in one run, then narrow to the regions worth a closer look.
Already narrowed the system? Skip the library and deposit the known composition straight away, as a uniform film or a test structure.
The last step after a screen. A wafer hit comes back as a uniform film, ready to test.
Applications
What you get back
The map ties composition to what was measured: where a phase boundary sits, where conductivity drops, where a property peaks. Off-gradient reproduction runs when a uniform film is the goal. Final integration and qualification testing stays downstream with you or your partner.
One wafer holding a smooth spread of compositions, so neighbors are judged side by side from the same run.
Structure, composition and response, tied to each of the 342 spots, with candidate and ruled-out regions marked.
Metals, nitrides, oxides, fast-ion conductors, and alloy or catalyst systems built from many elements.
A chosen composition, made again as a uniform film you can put straight into testing. Formats also include layer stacks, test structures and coated components.
Technical basis
The hard part is measuring enough to trust the map, then rebuilding the winner as a uniform film without losing what made it good.
One wafer carries the whole composition spread and is read at every position.
Enough resolution to catch where a property peaks or drops off between the two ends of the spread.
Seven sources set the composition during the run, so no custom alloy target has to be ordered first.
Any ternary or higher system built from them, spread across one wafer.
The probe follows the target property. Deeper tools come in when interface, surface state, or depth profile controls the result.
Contact
Bring a composition system, a functional target, and where it has to end up. A first call sorts out which of the three entry points fits, and most projects then start with a written proposal covering scope, timing and price before any deposition runs. That proposal also settles confidentiality and who owns the resulting data.
Email Parker Schmidt
Parker Schmidt, Commercial Lead
[email protected]